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- Title
DIFFERENTIAL LASER VOLTAGE PROBE: A BRIEF OVERVIEW AND THOUGHTS ON WHAT COULD COME NEXT.
- Authors
Dickson, Kristofor
- Abstract
The article discusses the evolution of laser voltage probe (LVP) techniques in failure analysis, highlighting recent advancements and challenges. It introduces the concept of "Differential LVP" (dLVP), which allows simultaneous acquisition of waveform data from passing and failing devices, offering insights into both logical state behavior and timing delays. It addresses issues such as waveform crosstalk and the difficulty of probing smaller technology nodes.
- Subjects
VOLTAGE; LASERS; FAILURE analysis
- Publication
Electronic Device Failure Analysis, 2024, Vol 26, Issue 2, p32
- ISSN
1537-0755
- Publication type
Article
- DOI
10.31399/asm.edfa.2024-2.p032