Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleNano Testing Symposium 2013.AuthorsWagner, LarryAbstractThe article offers information on the 33rd Nano Testing Symposium (NANOTS) sponsored by the Institute of Nano Testing in cooperation with the other engineering institutes and societies to be held in Osaka, Japan from November 13-15, 2013.SubjectsOSAKA (Japan); NANOTECHNOLOGY conferences; TESTINGPublicationElectronic Device Failure Analysis, 2013, Vol 15, Issue 3, p42ISSN1537-0755Publication typeProceeding