We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Effect of argon pressure on the physical characteristics of cadmium telluride (CdTe) thin films by close-spaced sublimation.
- Authors
Sharmin, Afrina; Mahmood, Syed Shafquat; Sultana, Munira; Aziz, Shahin; Shaikh, Md Aftab Ali; Bashar, Muhammad Shahriar
- Abstract
The close-spaced sublimation process (CSS) was used to deposit thin 5.2–6.7 μm CdTe films on the well-scrubbed borosilicate glass in this communication. The pinhole-free CdTe films with good adhesion were produced by adjusting the CSS Ar pressure profile inside the chamber at 250, 500, 750, and 1000 mTorr for 10 min to evaluate the film crystallinity and optoelectronic attributes. The source and substrate temperatures were reserved at 625 °C and 585 °C, respectively, for the deposition of CdTe thin films. Atomic force microscopy (AFM), X-ray diffraction (XRD), scanning electron microscopy (SEM), and a UV–Vis spectrophotometer are employed to investigate the microstructural and optoelectronic properties of these as-deposited films. The polycrystalline CdTe structure was revealed by XRD research, which revealed sharp features peak at (111), (220), and (311) orientations. The grain development relied on the deposition pressure in a SEM investigation. AFM shows mean roughness (Ra) and RMS roughness (Rq) values in the 199–293 nm and 245–357 nm ranges, respectively. The optical band gap ranged between 1.45 and 1.55 eV according to UV–Vis analyses. The relationship between Urbach energy (EU), skin depth (χ), steepness parameter (σ), refractive index (n), and other optoelectronic parameters with deposition pressure is thoroughly investigated. A correlation between the structural and optoelectronic properties of CdTe thin films and the deposition pressure in the Ar atmosphere of the as-deposited layers has been recognized through this study which is useful for designing and manufacturing CdTe solar cells and implies substantial commercial assurance.
- Subjects
THIN films; CADMIUM telluride; THIN film deposition; SOLAR cell manufacturing; ATOMIC force microscopy; BOROSILICATES; GRAIN
- Publication
Journal of Materials Science: Materials in Electronics, 2023, Vol 34, Issue 5, p1
- ISSN
0957-4522
- Publication type
Article
- DOI
10.1007/s10854-022-09603-w