Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleData-driven electron microscopy: electron diffraction imaging of materials structural properties.AuthorsZuo, Jian-Min; Yuan, Renliang; Shao, Yu-Tsun; Hsiao, Haw-Wen; Pidaparthy, Saran; Hu, Yang; Yang, Qun; Zhang, JiongPublicationMicroscopy, 2022, Vol 71, pi116ISSN2050-5698Publication typeArticleDOI10.1093/jmicro/dfab032