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- Title
Influence of Hydrogen Ions on the Performance of Thin-Film Transistors with Solution-Processed AlO x Gate Dielectrics.
- Authors
Wu, Yongbo; Lan, Linfeng; He, Penghui; Lin, Yilong; Deng, Caihao; Chen, Siting; Peng, Junbiao; Fu, Richard Yong-Qing
- Abstract
Over the past decade, there have been many reports on solution-processed oxide thin-film transistors (TFTs) with high mobility (even >100 cm2 V−1s−1). However, the capacitance uncertainty of the solution-processed oxide gate dielectrics leads to serious overestimation of the mobility. Here, solution-processed AlOx dielectrics are investigated systematically, and the effect of mobile ions on the frequency-dependent capacitance of the solution-processed AlOx dielectrics is also studied. It was found that the capacitance of the AlOx depends on the frequency seriously when the annealing temperature is lower than 300 °C, and the water treatment causes more seriously frequency-dependent capacitance. The strong frequency-dependent capacitance of the AlOx annealed at 250 or 300 °C is attributed to relaxation polarization of the weakly bound ions in the incompletely decomposed AlOx films. The water treatment introduces a large number of protons (H+) that would migrate to the ITO/AlOx interface under a certain electric field and form an electric double layer (EDL) that has ultrahigh capacitance at low frequency.
- Subjects
HYDROGEN ions; ELECTRIC double layer; DIELECTRICS; TRANSISTORS; ELECTRIC fields; ELECTRIC capacity
- Publication
Applied Sciences (2076-3417), 2021, Vol 11, Issue 10, p4393
- ISSN
2076-3417
- Publication type
Article
- DOI
10.3390/app11104393