Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleAn analytical algorithm for correction of edge effects in X-ray microfluorescence analysis of geological samples.AuthorsLankosz, Marek; Pella, Peter A.PublicationXRS: X-ray Spectrometry, 1994, Vol 23, Issue 4, p169ISSN0049-8246Publication typeArticleDOI10.1002/xrs.1300230406