Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleFront Cover: A frequency mapping method for locating functional units inside ICs based on coaxial microscope.AuthorsLiu, Pengcheng; Han, Jianwei; Ma, Yingqi; Zhang, Feng; Wu, Zongguo; Zhu, Xiang; Cui, YixinAbstractThe cover image is based on the Original Article A frequency mapping method for locating functional units inside ICs based on coaxial microscope by Yingqi Ma et al., https://doi.org/10.1049/ell2.12373.PublicationElectronics Letters (Wiley-Blackwell), 2022, Vol 58, Issue 3, piISSN0013-5194Publication typeArticleDOI10.1049/ell2.12430