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- Title
High-Resolution Magnetic Force Microscopy Using Carbon Nanotube Probes Fabricated Directly by Microwave Plasma-Enhanced Chemical Vapor Deposition.
- Authors
Tanaka, Kei; Yoshimura, Masamichi; Ueda, Kazuyuki
- Abstract
Carbon nanotubes (CNTs) have been successfully grown on the tip apex of an atomic force microscopy (AFM) cantilever by microwave plasma-enhanced chemical vapor deposition (MPECVD). Both scanning electron microscopy (SEM) and transmission electron microscopy (TEM) observations reveal that the diameter of the CNTs is ∼30nm and the magnetic particles with diameter of ∼20 nm, which was used as catalyst for the CNT growth, exist on the top. This CNT probe has been applied to magnetic force microscopy (MFM) on the ultrahigh-density magnetic recording media with 1200 kilo flux change per inch (kfci).
- Subjects
MAGNETIC resonance force microscopy; CARBON nanotubes; ATOMIC force microscopy; MICROWAVE plasmas; CHEMICAL vapor deposition; SCANNING electron microscopy; TRANSMISSION electron microscopy
- Publication
Journal of Nanomaterials, 2009, p1
- ISSN
1687-4110
- Publication type
Article
- DOI
10.1155/2009/147204