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- Title
Measuring the Extinction Index of Dielectric Films Using Frustrated Total Internal Reflectance Spectroscopy.
- Authors
Nguyen, V. B.; Gubanova, L. A.
- Abstract
Various methods of measuring the coefficient of light attenuation in optical coatings are considered. It is shown that the dimensionless extinction index of a coating made of a weakly absorbing film-forming material can be measured using a special attachment based on a parallelepiped-shaped optical prism. Parameters of the proposed attachment are calculated so that it could be arranged inside standard spectrophotometers.
- Subjects
DIELECTRIC films; TOTAL internal reflection (Optics); ATTENUATION of light; PARAMETER estimation; SPECTROPHOTOMETERS; PRISMS
- Publication
Technical Physics Letters, 2018, Vol 44, Issue 8, p746
- ISSN
1063-7850
- Publication type
Article
- DOI
10.1134/S1063785018080278