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- Title
Test Methodology Using PXI and High-Speed Digital I/O.
- Authors
Garza, Rick
- Abstract
The article describes the test methodology for an I²C characterization/validation system that applies the hardware-compare capabilities of a PXI 100-MHz digital high-speed input/output module of a digital oscilloscope. It is pointed out that the hardware-compare feature permits the direct comparison of data while it is being acquired. A PCI eXtensions for Instrumentation (PXI) design was reportedly selected because of its high speed and data throughput and synchronization of timing for the digital signals.
- Subjects
DIGITAL oscilloscopes; DATA transmission systems; COMPUTER peripherals; SYNCHRONIZATION; DIGITAL signal processing
- Publication
EE: Evaluation Engineering, 2010, Vol 49, Issue 7, p24
- ISSN
0149-0370
- Publication type
Article