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- Title
Intelligent Measurement System Based on Wavelet Analysis for Electromagnetic Interference Measurement.
- Authors
Lanyong Zhang; Fanming Liu; Bing Li
- Abstract
According to the problem that the speed of electromagnetic Interference (EMI) manual system is slow, an intelligent measurement system is designed for EMI measurement based on wavelet analysis and LabVIEW. With the characteristic of noise given, it can be suppressed by threshold function in wavelet-domain, and the pure electromagnetic radiation can be obtained. It introduces the constituting of system, testing principle, software structure, and solves the hard problems and key techniques such as hardware's controlling, algorithm's fast convergence and compatibility of software. Because the signal includes the ambient noise, the wavelet analysis is applied to filter the noise and gain the real conducted electromagnetic interference. Comparing with the other traditional apparatuses and the manual testing, the system improves the testing efficiency and has good extensibility.
- Subjects
ARTIFICIAL intelligence; WAVELETS (Mathematics); ELECTROMAGNETIC interference measurement; ELECTROMAGNETIC radiation; COMPUTER software; PROBLEM solving; SOFTWARE compatibility
- Publication
International Review on Computers & Software, 2012, Vol 7, Issue 5, p2372
- ISSN
1828-6003
- Publication type
Article