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- Title
Influence of the metallic contact surface area on the low-frequency noises of metal-semiconductor contacts.
- Authors
KHONDKARYAN, H. D.
- Abstract
CVC and low-frequency noises of metal-semiconductor contacts at the room temperature have been researched when the current flows through volume and surface of the samples. We investigate CVC and low-frequency spectra of diode structures with one Schottky barrier and with double oppositely offset barriers made on Cr/n-Si, W/n-Si contacts. It is shown that CVC and the level of the noises strongly depend on the surface area of the metallic contacts. The Physical processes taking part in the volume and surface of this structures which are influences on the behavior of low-frequency noises, are also presented. It is show that for decreasing of the lowfrequency noises' level it is more reasonable to use contacts with small surface area.
- Subjects
SCHOTTKY barrier; DIODES; METAL semiconductor field-effect transistors; SURFACE area; SILICON diodes; SEMICONDUCTOR-metal boundaries
- Publication
Armenian Journal of Physics, 2015, Vol 8, Issue 1, p30
- ISSN
1829-1171
- Publication type
Article