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- Title
Structure of Si(001)-(4×3)-In Surface Studied by X-Ray Photoelectron Diffraction.
- Authors
Shimomura, M.; Nakamura, T.; Kim, K.-S.; Abukawa, T.; Tani, J.; Kono, S.
- Abstract
X-ray photoelectron diffraction (XPD) patterns of In 3d core levels have been measured for the Si(001)(4 × 3)-In surface. An R factor analysis with single-scattering and multiple-scattering simulations of In 3d XPD patterns was performed for three structural models proposed so far. Only the model proposed by surface X-ray diffraction [Appl. Surf. Sci. 123/124, 104 (1998)] appeared to give a reasonably small R factor when the geometric parameters were modified from the original ones.
- Subjects
GEOMETRIC surfaces; OPTICAL diffraction; PHOTOELECTRONS
- Publication
Surface Review & Letters, 1999, Vol 6, Issue 6, p1097
- ISSN
0218-625X
- Publication type
Article
- DOI
10.1142/S0218625X99001219