Found: 14
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Automotive reliability prediction based on early field failure warranty data.
- Published in:
- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 103, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<103::AID-QRE147>3.0.CO;2-5
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- Publication type:
- Article
Book review:Inroads to Software Quality, Alka Jarvis and Vern Crandall, Prentice-Hall, 1997. Number of pages; 417. Price; $40.95/£23.95.
- Published in:
- 1998
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- Publication type:
- Book Review
Book review:Systems Maintainability; Analysis, Engineering and Management, Jezdimir Knecevic, Chapman and Hall, 1997. Number of pages; 419. Price £49.95.
- Published in:
- 1998
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- Publication type:
- Book Review
Book review:Influence of Temperature on Microelectronics and System Reliability, Pradeep Lall, Michael G. Pecht and Edward B. Hakim, CRC Press, 1997. Number of pages; 322.
- Published in:
- 1998
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- Publication type:
- Book Review
Electrical characterization and reliability evaluation of capacitors by means of in situ leakage current measurements.
- Published in:
- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 63, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<63::AID-QRE160>3.0.CO;2-P
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- Publication type:
- Article
Book review:High Temperature Electronics, F. Patrick McCluskey, Richard Grzybowski and Thomas Podlesak (editors), CRC Press, 1997. Number of pages; 337.
- Published in:
- 1998
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- Publication type:
- Book Review
Generation of 1/f spectrum by relaxation process in thin film resistors.
- Published in:
- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 69, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<69::AID-QRE161>3.0.CO;2-4
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- Publication type:
- Article
Bimodal failure behaviour of metal film resistors.
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- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 87, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<87::AID-QRE166>3.0.CO;2-U
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- Publication type:
- Article
1/f noise of electrolytic capacitors as a reliability indicator.
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- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 83, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<83::AID-QRE165>3.0.CO;2-8
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- Publication type:
- Article
Reliability comparison of tantalum and niobium solid electrolytic capacitors.
- Published in:
- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 79, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<79::AID-QRE163>3.0.CO;2-Y
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- Publication type:
- Article
Polarization and fluctuation characteristics of tantalum solid electrolyte capacitors.
- Published in:
- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 73, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<73::AID-QRE162>3.0.CO;2-I
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- Publication type:
- Article
Obtaining more accurate resistance measurements using the six-wire ohms measurement technique.
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- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 95, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<95::AID-QRE168>3.0.CO;2-T
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- Publication type:
- Article
Quality and reliability aspects of passive components.
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- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 61, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<61::AID-QRE170>3.0.CO;2-U
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- Publication type:
- Article
Comparison between piezoelectric method and ultrasonic signal analysis for crack detection in type II multilayer ceramic capacitors.
- Published in:
- Quality & Reliability Engineering International, 1998, v. 14, n. 2, p. 91, doi. 10.1002/(SICI)1099-1638(199803/04)14:2<91::AID-QRE167>3.0.CO;2-7
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- Publication type:
- Article