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- Title
DO THE LATEST SCANNING ELECTRON MICROSCOPES WITH A VARIETY OF ANALYTICAL AND IMAGING TECHNIQUES PROVIDE US WITH REALISTIC IMAGES AND COMPOSITIONS?
- Authors
Donik, Črtomir
- Abstract
The scanning electron microscope (SEM) has become a must-have for any research institution, university, or industry involved in material production, treatment, processing, research or even distribution. The SEM has evolved into probably the most common analytical tool in the materials research community, with its imaging, elemental analytics, phase analyses, local micro-stress analyses, in-situ cross-section preparation, lamella preparation for TEM, etc. Since the number of SEMs has drastically increased, due to its availability and its wide range of uses, increasing numbers of poorly trained SEM operators are involved in materials research and development. The resulting problem is that all analytical instruments always show "something" and the operator must know the limitations of the technique. The skilled and properly trained operator understands the physics behind the SEM and its associated analytical techniques, such as EDS, WDS, SIMS, EBSD, BEI, and ECCI.
- Subjects
SCANNING electron microscopes; CROSS-sectional method; AUGER electron spectroscopy; MATERIALS analysis; X-rays
- Publication
Materials & Technologies / Materiali in Tehnologije, 2019, Vol 53, Issue 6, p929
- ISSN
1580-2949
- Publication type
Article
- DOI
10.17222/mit.2019.269