Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleModeling thin layers of analytes on substrates for spectral analysis: use of solid/liquid n and k values to model reflectance spectra.AuthorsBernacki, Bruce E.; Johnson, Timothy J.; Myers, Tanya L.PublicationOptical Engineering, 2020, Vol 59, Issue 9, p92005ISSN0091-3286Publication typeArticleDOI10.1117/1.OE.59.9.092005