Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleHigh-performance X-ray detection in a new analytical electron microscope.AuthorsLYMAN, C. E.; GOLDSTEIN, J. I.; WILLIAMS, D. B.; ACKLAND, D. W.; HARRACH, S.; NICHOLLS, A. W.; STATHAM, P. J.PublicationJournal of Microscopy, 1994, Vol 176, Issue 2, p85ISSN0022-2720Publication typeArticleDOI10.1111/j.1365-2818.1994.tb03503.x