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- Title
Genetic Influence on ERP Slow Wave Measures of Working Memory.
- Authors
Hansell, N.K.; Wright, M.J.; Geffen, G.M.; Geffen, L.B.; Smith, G.A.; Martin, N.G.
- Abstract
Individual differences in the variance of event-related potential (ERP) slow wave (SW) measures were examined. SW was recorded at prefrontal and parietal sites during memory and sensory trials of a delayed-response task in 391 adolescent twin pairs. Familial resemblance was identified and there was a strong suggestion of genetic influence. A common genetic factor influencing memory and sensory SW was identified at the prefrontal site (accounting for an estimated 35%–37% of the reliable variance) and at the parietal site (51%–52% of the reliable variance). Remaining reliable variance was influenced by unique environmental factors. Measurement error accounted for 24% to 30% of the total variance of each variable. The results show genetic independence for recording site, but not trial type, and suggest that the genetic factors identified relate more directly to brain structures, as defined by the cognitive functions they support, than to the cognitive networks that link them.
- Subjects
EVOKED potentials (Electrophysiology); SHORT-term memory; GENETICS; BEHAVIOR genetics
- Publication
Behavior Genetics, 2001, Vol 31, Issue 6, p603
- ISSN
0001-8244
- Publication type
Article
- DOI
10.1023/A:1013301629521