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- Title
Reflection, transmission and ellipsometric parameters of the multilayer structure using a bi-characteristic-impedance transmission line approach.
- Authors
TAYA, SOFYAN A.; ABU NASR, MUSTAFA H.; EL-AGEZ, TAHER M.
- Abstract
Ellipsometry is a powerful tool for studying the optical properties of multilayer structures. All the information extracted from an ellipsometer is found in two angles called the ellipsometric parameters Ψ and Δ. The transfer matrix approach is usually used to find the reflectance, transmittance, and ellipsometric parameters of planar multilayer structures. In this work, an equivalent model based on the bi-characteristic-impedance transmission line (BCITL) is employed to model planar multilayer structures. We here apply the BCITL formalism to investigate the reflectance of electromagnetic waves from an isotropic multilayer structure. Moreover, the ellipsometric parameters Ψ and Δ for any number of layers are calculated using the BCITL approach. The properties of a Bragg reflector are also presented.
- Subjects
OPTICAL reflection; ELLIPSOMETRY; OPTICAL multilayers; RADIO lines; TRANSFER matrix; TRANSMITTANCE (Physics)
- Publication
Optica Applicata, 2013, Vol 43, Issue 4, p817
- ISSN
0078-5466
- Publication type
Article
- DOI
10.5277/oa130417