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- Title
Removing the parachuting artifact using two-way scanning data in high-speed atomic force microscopy.
- Authors
Shintaroh Kubo; Kenichi Umeda; Noriyuki Kodera; Shoji Takada
- Abstract
The high-speed atomic force microscopy (HS-AFM) is a unique and prominent method to observe structural dynamics of biomolecules at single molecule level at near-physiological condition. To achieve high temporal resolution, the probe tip scans the stage at high speed which can cause the so-called parachuting artifact in the HSAFM images. Here, we develop a computational method to detect and remove the parachuting artifact in HS-AFM images using the two-way scanning data. To merge the two-way scanning images, we employed a method to infer the piezo hysteresis effect and to align the forward- and backward-scanning images. We then tested our method for HS-AFM videos of actin filaments, molecular chaperone, and duplex DNA. Together, our method can remove the parachuting artifact from the raw HS-AFM video containing two-way scanning data and make the processed video free from the parachuting artifact. The method is general and fast so that it can easily be applied to any HSAFM videos with two-way scanning data.
- Subjects
PARACHUTING; ATOMIC force microscopy; MOLECULAR chaperones; SINGLE molecules; STRUCTURAL dynamics; PARACHUTES; BIOMOLECULES
- Publication
Biophysics & Physicobiology, 2023, Vol 20, Issue 1, p1
- ISSN
2189-4779
- Publication type
Article
- DOI
10.2142/biophysico.bppb-v20.0006