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- Title
Aldo van Eyck and Louis I. Kahn: Parallels in the Other Tradition of Modern Architecture.
- Authors
MCCARTER, ROBERT
- Abstract
The third generation Modern Dutch architect Aldo van Eyck and the second generation Modern American architect Louis I. Kahn met for the first time at the 11th CIAM conference held in Otterlo, the Netherlands in September 1959. During this conference, at which both Van Eyck and Kahn gave lectures and presentations of their works, the two architects discovered there were a remarkable number of parallels between their practices, including their fundamentally ethical interpretations of architecture; their search for timeless ordering principles; their drawing inspiration from the other arts; the anthropological, historical and tectonic grounding of their work; the spatial structure of their buildings and unbuilt designs; and their commitment to the architecture of the city, and the urban life that takes place there.
- Subjects
VAN Eyck, Aldo; KAHN, Louis I.; MODERN architecture; ARCHITECTS; ARCHITECTURE &; ethics
- Publication
ZARCH: Journal of Interdisciplinary Studies in Architecture & Urbanism, 2018, Issue 10, p44
- ISSN
2341-0531
- Publication type
Article
- DOI
10.26754/ojs_zarch/zarch.2018102929