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- Title
USING HIGH RESOLUTION S/TEM TO ANALYZE SMARTPHONE DISPLAYS.
- Abstract
The article focuses on the use of high resolution scanning transmission electron microscopy (S/TEM) in the analysis of smartphone displays. Topics discussed include the specialized microstructure of materials and systems approach Europe's application-oriented research organization Fraunhofer Institute for Microstructure of Materials and Systems IMWS, employment of industrial failure analysis and quality monitoring in the detection and control of defects and faults, and reliability testing.
- Subjects
SCANNING transmission electron microscopy; SMARTPHONES; DISPLAY systems; FAILURE analysis; SYSTEM failures; RELIABILITY in engineering
- Publication
Advanced Materials & Processes, 2016, Vol 174, Issue 2, p16
- ISSN
0882-7958
- Publication type
Article
- DOI
10.31399/asm.amp.2016-02.p016