Found: 31
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Measurement of single‐crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π.
- Published in:
- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 734, doi. 10.1107/S1600576720005154
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- Article
X‐ray pulse stretching after diffraction.
- Published in:
- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 623, doi. 10.1107/S1600576720003714
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- Article
Ptychographic X‐ray speckle tracking.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 760, doi. 10.1107/S1600576720005567
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- Article
How To Be a Better Scientist. By Andrew C. Johnson and John P. Sumpter. Taylor and Francis, 2018. Pp. 248. Price GBP 15.19 ISBN 9781138731295 (paperback), GBP 76.00 ISBN 9781138731219 (hardback), GBP 12.34 ISBN 9781315189079 (ebook).
- Published in:
- 2020
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- Publication type:
- Book Review
Handbook of Industrial Crystallization. Third edition. Edited by Allan S. Myerson, Deniz Erdemir and Alfred Y. Lee. Cambridge University Press, 2019. Pp. 538. Price GBP 145 (hardcover). ISBN 9780521196185.
- Published in:
- 2020
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- Publication type:
- Book Review
Effects of surface undulations on asymmetric X‐ray diffraction: a rocking‐curve topography study.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 789, doi. 10.1107/S1600576720005166
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- Article
Takagi–Taupin dynamical X‐ray diffraction simulations of asymmetric X‐ray diffraction from crystals: the effects of surface undulations.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 793, doi. 10.1107/S1600576720005178
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- Article
A thermal‐gradient approach to variable‐temperature measurements resolved in space.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 662, doi. 10.1107/S160057672000415X
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- Article
Compressive strain formation in surface‐damaged crystals.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 629, doi. 10.1107/S1600576720003702
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- Article
Calculation of total scattering from a crystalline structural model based on experimental optics parameters.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 671, doi. 10.1107/S1600576720002940
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- Article
Impact and behavior of Sn during the Ni/GeSn solid‐state reaction.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 605, doi. 10.1107/S1600576720003064
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- Publication type:
- Article
SVAT4: a computer program for visualization and analysis of crystal structures.
- Published in:
- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 848, doi. 10.1107/S1600576720004586
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- Article
Stochastic models of dense or hollow nanoparticles and their scattering properties.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 811, doi. 10.1107/S1600576720005464
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- Article
A novel experimental approach for nanostructure analysis: simultaneous small‐angle X‐ray and neutron scattering.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 722, doi. 10.1107/S1600576720005208
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- Article
Pattern‐matching indexing of Laue and monochromatic serial crystallography data for applications in materials science.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 824, doi. 10.1107/S160057672000521X
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- Article
Equatorial aberration of powder diffraction data collected with an Si strip X‐ray detector by a continuous‐scan integration method.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 679, doi. 10.1107/S1600576720005130
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- Publication type:
- Article
Full reciprocal‐space mapping up to 2000 K under controlled atmosphere: the multipurpose QMAX furnace.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 650, doi. 10.1107/S160057672000432X
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- Article
Dual‐energy crystal‐analyzer scheme for spectral tomography.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 781, doi. 10.1107/S1600576720005439
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- Article
SingleCrystal 4: real‐time multi‐phase diffraction simulation.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 860, doi. 10.1107/S1600576720006378
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- Article
Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 635, doi. 10.1107/S1600576720003775
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- Article
Exact and fast calculation of the X‐ray pair distribution function.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 710, doi. 10.1107/S1600576720004616
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- Publication type:
- Article
sasPDF: pair distribution function analysis of nanoparticle assemblies from small‐angle scattering data.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 699, doi. 10.1107/S1600576720004628
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- Publication type:
- Article
CrystalCMP: automatic comparison of molecular structures.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 841, doi. 10.1107/S1600576720003787
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- Article
Sub‐millisecond time‐resolved small‐angle neutron scattering measurements at NIST.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 598, doi. 10.1107/S1600576720004367
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- Article
X‐ray diffraction using focused‐ion‐beam‐prepared single crystals.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 614, doi. 10.1107/S1600576720003143
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- Article
3D‐printed holders for in meso in situ fixed‐target serial X‐ray crystallography.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 854, doi. 10.1107/S1600576720002897
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- Article
Optimization of crystallization of biological macromolecules using dialysis combined with temperature control.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 686, doi. 10.1107/S1600576720003209
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- Article
Hydrogen/deuterium exchange behavior in tetragonal hen egg‐white lysozyme crystals affected by solution state.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 837, doi. 10.1107/S1600576720005488
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- Article
Information gain from isotopic contrast variation in neutron reflectometry on protein–membrane complex structures.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 800, doi. 10.1107/S1600576720005634
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- Article
X‐ray ptychographic mode of self‐assembled CdSe/CdS octapod‐shaped nanocrystals in thick polymers.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 741, doi. 10.1107/S160057672000583X
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- Article
Near, far, wherever you are: simulations on the dose efficiency of holographic and ptychographic coherent imaging.
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- Journal of Applied Crystallography, 2020, v. 53, n. 3, p. 748, doi. 10.1107/S1600576720005816
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- Article