Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleLattice parameter determination of a strained area of an InAs layer on a GaAs substrate using CBED.AuthorsTakayuki Akaogi; Kenji Tsuda; Masami Terauchi; Michiyoshi TanakaPublicationJournal of Electron Microscopy, 2004, Vol 53, Issue 1, p11ISSN0022-0744Publication typeArticleDOI10.1093/jmicro/53.1.11