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- Title
Structural characterization of shock-affected sapphire.
- Authors
Mazilu, M.; Juodkazis, S.; Ebisui, T.; Matsuo, S.; Misawa, H.
- Abstract
The presence of dislocations has been revealed by numerical processing of high–resolution transmission electron microscopy images from the regions affected by a shock wave propagation. The shock wave was triggered by a single 220 fs duration pulse of 30 nJ at an 800 nm wavelength inside sapphire at approximately 10 μm depth. The shock-amorphised sapphire has a distinct boundary with the crystalline phase, which is not wet etchable even at a dislocation density of ≃8×1012 cm-2.
- Subjects
SAPPHIRES; TRANSMISSION electron microscopy; SHOCK waves; NANOSTRUCTURES; SEMICONDUCTOR etching; WAVELENGTHS
- Publication
Applied Physics A: Materials Science & Processing, 2006, Vol 86, Issue 2, p197
- ISSN
0947-8396
- Publication type
Article
- DOI
10.1007/s00339-006-3732-8