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- Title
Structure and dielectric properties of NdSrTiO ceramics for energy storage application.
- Authors
Shen, Zong-Yang; Li, Yue-Ming; Luo, Wen-Qin; Wang, Zhu-Mei; Gu, Xing-Yong; Liao, Run-Hua
- Abstract
Polycrystalline Nd-doped SrTiO ceramics with the formula NdSrTiO (NSTO, x = 0, 0.024, 0.056, 0.104, 0.152, 0.200) were prepared by solid state reaction route. X-ray diffraction (XRD) analysis confirmed the formation of monophasic compounds and indicated the structure to be changed from cubic to tetragonal by increasing Nd doping concentrations. A remarkable decrease in grain size from ~30 μm for un-doped SrTiO ceramics to ~1 μm for Nd-doped SrTiO ceramics with x = 0.024 was observed by scanning electron microscopy. The grain size had a degree of increasing with further increasing Nd doping concentration and reached ~3 μm when the x value was 0.200. The dielectric properties of NSTO ceramics were measured at 1 kHz in ambient temperature. It revealed that the dielectric constant dramatically increases for the reason of Nd doping, leading to a maximum value of 19,800 for as-sintered sample with x = 0.104. The breakdown strength of all Nd-doped SrTiO samples was found to be higher than 10 kV/mm. The relationship between dielectric properties and the microstructure feature, as well as the defect structures correlated with the charge compensation induced by trivalent Nd doping, was discussed tentatively.
- Subjects
SEMICONDUCTOR doping; NEODYMIUM compounds; POLYCRYSTALLINE semiconductors; X-ray diffraction; DIELECTRIC devices; SCANNING electron microscopy
- Publication
Journal of Materials Science: Materials in Electronics, 2013, Vol 24, Issue 2, p704
- ISSN
0957-4522
- Publication type
Article
- DOI
10.1007/s10854-012-0798-2