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- Title
Coherent X-Ray Diffraction Imaging of Morphology and Strain in Nanomaterials.
- Authors
Harder, Ross; Robinson, Ian
- Abstract
The last decade has seen a remarkable surge in x-ray characterization methods (Willmott, An Introduction to Synchrotron Radiation, John Wiley & Sons, Inc., New York, 2011). Imaging with x-rays has evolved from simple radiography, to image internal structure and diagnose injury, to a full-fledged tool for nanoscale characterization (Holt et al., Annu Rev Mater Res 43:1, 2013). Central to this development has been the advent of high-brilliance synchrotron and free electron laser sources of x-rays. The high degree of spacial coherence of the resulting beams has enabled novel imaging methods. Of these, coherent diffraction imaging has proven highly successful at imaging the structure in nano materials (Miao et al., Nature 400:342, 1999). In addition, this imaging method can be combined with Bragg diffraction to image strain with high sensitivity (Pfeifer et al., Nature 442:63, 2006; Robinson and Harder, Nat Mater 8:291, 2009).
- Subjects
X-ray diffraction; RADIOGRAPHY; TRAUMATOLOGY diagnosis; NANOSTRUCTURED materials; FREE electron lasers
- Publication
JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2013, Vol 65, Issue 9, p1202
- ISSN
1047-4838
- Publication type
Article
- DOI
10.1007/s11837-013-0682-4