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- Title
Analysis of crystalline perfection of pure and Modoped KTP crystals on different growth planes by high-resolution X-ray diffraction.
- Authors
Gandhi, Jayavelu Rajeev; Rathnakumari, Muthian; Muralimanohar, Pandarinathan; Sureshkumar, Palanivel; Bhagavannarayana, Godavarthi
- Abstract
Single crystals of pure and molybdenum (Mo)-doped potassium titanyl phosphate (KTP) crystals were grown by the high-temperature solution growth technique. The presence of dopant ions in the grown crystal was confirmed by energy-dispersive X-ray analysis. Grown crystals, cut along various growth planes such as (100), (011) or (201), were analysed for crystalline perfection using high-resolution X-ray diffraction (HRXRD). Although the HRXRD study showed that the crystalline perfection of most of the crystals was quite good without any structural defects, structural grain boundaries were observed in some of the crystals chosen for study. The observed structural defects are probably due to mechanical or thermal fluctuations occurring during the growth process.
- Subjects
SINGLE crystals; CRYSTAL whiskers; X-ray diffraction; POTASSIUM titanyl phosphate; NONLINEAR optical materials
- Publication
Journal of Applied Crystallography, 2014, Vol 47, Issue 3, p931
- ISSN
0021-8898
- Publication type
Article
- DOI
10.1107/S1600576714006840