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- Title
Buffer effects on the mosaic structure of the HR-GaN grown on 6H-SiC substrate by MOCVD.
- Authors
Arslan, Engin; Öztürk, Mustafa; Tıraş, Engin; Tıraş, Tülay; Özçelik, Süleyman; Özbay, Ekmel
- Abstract
High-resistive GaN (>10 Ω cm) layers have been grown with different buffer structures on 6H-SiC substrate using metalorganic chemical vapor deposition reactor. Different combination of the GaN/AlN super lattice, low temperature AlN, high temperature AlN and AlGaN (x ≈ 0.67) layers were used in the buffer structures. The growth parameters of the buffer layers were optimized for obtaining a high-resistive GaN epilayer. The mosaic structure parameters, such as lateral and vertical coherence lengths, tilt and twist angle (and heterogeneous strain), and dislocation densities (edge and screw dislocations) of the high-resistive GaN epilayers have been investigated using x-ray diffraction measurements. In addition, the residual stress behaviors in the high-resistive GaN epilayers were determined using both x-ray diffraction and Raman measurements. It was found that the buffer structures between the HR-GaN and SiC substrate have been found to have significant effect on the surface morphology and the mosaic structures parameters. On the other hand, both XRD and Raman results confirmed that there is low residual stress in the high-resistive GaN epilayers grown on different buffer structures.
- Subjects
BUFFER solutions; MOSAIC structure; METAL organic chemical vapor deposition; ALUMINUM gallium nitride; GALLIUM nitride spectra; X-ray diffraction; RAMAN spectra
- Publication
Journal of Materials Science: Materials in Electronics, 2017, Vol 28, Issue 4, p3200
- ISSN
0957-4522
- Publication type
Article
- DOI
10.1007/s10854-016-5909-z