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- Title
Resonant inelastic X-ray scattering spectrometer with 25 meV resolution at the Cu K-edge.
- Authors
Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin; Upton, Mary; Taherkhani, Mehran; Spiwek, Manfred; Dill, Frank-Uwe; Wille, Hans-Christian; Yavaş, Hasan
- Abstract
An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.
- Subjects
X-ray scattering; X-ray spectrometers; MONOCHROMATORS; PHONONS; SINGLE crystals
- Publication
Journal of Synchrotron Radiation, 2015, Vol 22, Issue 4, p961
- ISSN
0909-0495
- Publication type
Article
- DOI
10.1107/S1600577515009686