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- Title
Temperature-dependent thermal properties of Ru/C multilayers.
- Authors
Yan, Shuai; Jiang, Hui; Wang, Hua; He, Yan; Li, Aiguo; Zheng, Yi; Dong, Zhaohui; Tian, Naxi
- Abstract
Multilayers made of Ru/C are the most promising candidates when working in the energy region 8-20 keV. The stability of its thermal properties, including thermal expansion and thermal conduction, needs to be considered for monochromator or focusing components. Ru/C multilayers with periodic thicknesses of 3, 4 and 5 nm were investigated in situ by grazing-incidence X-ray reflectometry and diffuse scattering in order to study their thermal expansion characteristics as a function of annealing temperature up to 400°C. The thermal conductivity of multilayers with the same structure was also measured by the transient hot-wire method and compared with bulk values.
- Subjects
MULTILAYERS; THERMAL expansion; THERMAL conductivity; X-ray reflectometry; ANNEALING of metals; HOT-wire anemometer
- Publication
Journal of Synchrotron Radiation, 2017, Vol 24, Issue 5, p975
- ISSN
0909-0495
- Publication type
Article
- DOI
10.1107/S1600577517008542