Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleA systematic database of thin-film measurements by EPMA Part II-Palladium films.AuthorsBastin, G. F.; Heijligers, H. J. M.PublicationXRS: X-ray Spectrometry, 2000, Vol 29, Issue 5, p373ISSN0049-8246Publication typeArticleDOI10.1002/1097-4539(200009/10)29:5<373::AID-XRS442>3.0.CO;2-S