Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleReduction of penetration effect at sharp edges in the scanning electron microscope (SEM).AuthorsWells, Oliver C.; Bailey, Phillip J.PublicationJournal of Microscopy, 1985, Vol 138, Issue 1, pRP3ISSN0022-2720Publication typeArticleDOI10.1111/j.1365-2818.1985.tb02590.x