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- Title
The Overlayer Structure on the Si(001)-(2×3)-Ag Surface Determined by X-ray Photoelectron Diffraction.
- Authors
Shimomura, M.; Abukawa, T.; Higa, M.; Nakamura, M.; Shivaprasad, S. M.; Yeom, H. W.; Suzuki, S.; Sato, S.; Tani, J.; Kono, S.
- Abstract
X-ray photoelectron diffraction (XPD) patterns of Ag 3d electrons from a single domain Si(001)-(2×3)-Ag surface were examined. Single scattering cluster and multiple scattering cluster simulations of the Ag 3d XPD patterns indicate an overlayer that contains four Ag atoms aligned almost linearly along the threefold direction in the unit cell on the Si(001) surface. The four-Ag-atom arrangement is discussed in the light of other information obtained by STM, LEEM and photoemission studies, finding it very feasible.
- Publication
Surface Review & Letters, 1998, Vol 5, Issue 5, p953
- ISSN
0218-625X
- Publication type
Article
- DOI
10.1142/S0218625X98001286