Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleToF-SIMS Investigations of Tip-Surface Chemical Interactions in Atomic Force Microscopy on a Combined AFM/ToF-SIMS Platform.AuthorsBrown, Chance C.; Ievlev, Anton V.; Maksymovych, Petro; Kalinin, Sergei V.; Ovchinnikova, Olga S.PublicationMicroscopy & Microanalysis, 2017, Vol 23, p2082ISSN1431-9276Publication typeArticleDOI10.1017/S1431927617011072