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- Title
Scanning microscopy by mid-infrared near-field scattering.
- Authors
Knoll, B.; Keilmann, F.
- Abstract
Abstract. We investigate mid-infrared imaging of dielectric and metallic surfaces by an "apertureless" SNOM approach of scattering CO[sub 2]-laser radiation from an AFM tip. In the microscopic images we find and identify a new type of AFM-induced artifact (crosstalk via the tapping amplitude). Minimizing this by proper scan parameters we obtain evidence of true infrared contrast. The results demonstrate the material-sensitive potential of infrared-spectroscopic imaging and a spatial resolving power of better than 100 nm.
- Subjects
DIELECTRICS; CARBON dioxide; LASER beams; ATOMIC force microscopy
- Publication
Applied Physics A: Materials Science & Processing, 1998, Vol 66, Issue 5, p477
- ISSN
0947-8396
- Publication type
Article
- DOI
10.1007/s003390050699