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- Title
Mit Intelligenz von der Messung zur Information – VDI-Zukunftsforum in Ettlingen –.
- Authors
Sommer, Klaus-Dieter; Härtig, Frank; Heizmann, Michael; Kaiser, Ulrich
- Abstract
In November 2022, the VDI Future Forum "From Measurement to Information with Intelligence" took place in Ettlingen near Karlsruhe. The event focused on intelligent sensors and measurement systems, connected measurement systems and their virtual representations, as well as quantum sensing and direct metrological traceability. The goal of further research and development in measurement technology and metrology is to establish a correlation between measurement uncertainty and quality assessments in deep learning and artificial intelligence. The traceability of measurements to the SI system plays an important role, as does the application of quantum sensing. The special issue of the journal "Technisches Messen" contains contributions on various aspects of measurement technology and metrology.
- Subjects
INTELLIGENT sensors; QUANTUM wells; ARTIFICIAL intelligence; INFORMATION measurement; METROLOGY; DEEP learning
- Publication
Technisches Messen, 2024, Vol 91, Issue 1, p1
- ISSN
0171-8096
- Publication type
Article
- DOI
10.1515/teme-2023-0154