Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleUse of quantitative convergent-beam electron diffraction in materials science.AuthorsHolmestad, Randi; Birkeland, Christophe R.; Marthinsen, Knut; Høier, Ragnvald; Zuo, Jian MinPublicationMicroscopy Research & Technique, 1999, Vol 46, Issue 2, p130ISSN1059-910XPublication typeArticleDOI10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O