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- Title
Diamond as Advanced Material for Scanning Probe Microscopy Tips.
- Authors
Kranz, Christine
- Abstract
Synthetic diamond and conductive, doped forms of diamond are ideally suited materials for scanning probe microscopy tips due to their inherent physical, chemical, and mechanical properties. In particular for atomic force microscopy (AFM) and related techniques, which require a conductive tip in permanent contact to the sample surface, boron-doped diamond (BDD) is an excellent material. Only few examples have so far been demonstrated using boron-doped diamond microelectrodes as probes for scanning electrochemical microscopy (SEM) or AFM-SECM. This review focuses on the state-of-the-art using diamond-coated SPM tips and conductive boron-doped diamond as probe material discussing advantages and disadvantages.
- Subjects
DIAMONDS; SCANNING probe microscopy; MECHANICAL behavior of materials; SURFACE chemistry; MICROELECTRODES
- Publication
Electroanalysis, 2016, Vol 28, Issue 1, p35
- ISSN
1040-0397
- Publication type
Article
- DOI
10.1002/elan.201500630