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- Title
OPPORTUNITY OR BURDEN? The case for reinvigorating the closed analytical loop.
- Authors
Verbitsky, David E.; Duffy, Grace L.
- Abstract
The article offers information on closed analytical loop that conducts internal and external failure analysis (FA) of malfunctions, and corrective and preventive action (CAPA) to minimize deficiencies. Topics include closed feedback loops which reacted to safety and reliability- related malfunctions occurring after ongoing qualified shipment to customers; poor databases in FA-CAPA loop; and emphasis on safety, quality and reliability shifted away from overall closed loop improvements.
- Subjects
FAILURE analysis; PSYCHOLOGICAL feedback; ELECTRONICS; QUALITY control charts; MASS production
- Publication
Quality Progress, 2020, Vol 53, Issue 7, p28
- ISSN
0033-524X
- Publication type
Article