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- Title
Failure Analysis: Why Mistakes Are Made and How to Avoid Making One.
- Authors
Burgess, David
- Abstract
The article discusses a data collection and analysis process called Failure analysis focusing on errors in analysis and necessary corrective actions. Topics include semiconductor failure analysis, improved tools and technology, lack of understanding on the topic, failure mode and electrical overstress, Field-effect transistors, printed circuit board mechanisms, and root-cause analysis.
- Subjects
COMPUTERS in failure analysis (Engineering); ROOT cause analysis; SYSTEM failures; FIELD-effect transistors; SEMICONDUCTOR failures; PRINTED circuits
- Publication
Journal of Failure Analysis & Prevention, 2014, Vol 14, Issue 6, p697
- ISSN
1547-7029
- Publication type
Article
- DOI
10.1007/s11668-014-9891-6