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- Title
The use of advanced characterization to study transitions across solid state interfaces.
- Authors
Srinivasan, R.; Banerjee, R.; Viswanathan, G. B.; Nag, S.; Hwang, J. Y.; Tiley, J.; Fraser, H. L.
- Abstract
The atomic-scale study of solid-solid interfaces in complex multi-phase multicomponent systems is a challenging but important endeavor. This article highlights the coupling of recently developed advanced characterization techniques, such as high resolution scanning transmission electron microscopy, carried out in an aberration-corrected microscope, and atom probe tomography, to address the structural and compositional transition at the atomic scale across solid-solid interfaces, such as the γ/γ′interface in nickel-base superalloys and the α/β interface in titanium alloys. Possible implications of such investigations of the interface on the understanding of physical and mechanical properties are discussed.
- Subjects
INTERFACES (Physical sciences); SCANNING electron microscopes; TOMOGRAPHY; MICROSTRUCTURE; NANOSTRUCTURED materials; HEAT resistant alloys
- Publication
JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2010, Vol 62, Issue 12, p64
- ISSN
1047-4838
- Publication type
Article
- DOI
10.1007/s11837-010-0183-7