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- Title
Soft X‐ray varied‐line‐spacing gratings fabricated by near‐field holography using an electron beam lithography‐written phase mask.
- Authors
Lin, Dakui; Liu, Zhengkun; Dietrich, Kay; Sokolov, Andréy; Sertsu, Mewael Giday; Zhou, Hongjun; Huo, Tonglin; Kroker, Stefanie; Chen, Huoyao; Qiu, Keqiang; Xu, Xiangdong; Schäfers, Franz; Liu, Ying; Kley, Ernst-Bernhard; Hong, Yilin
- Abstract
A fabrication method comprising near‐field holography (NFH) with an electron beam lithography (EBL)‐written phase mask was developed to fabricate soft X‐ray varied‐line‐spacing gratings (VLSGs). An EBL‐written phase mask with an area of 52 mm × 30 mm and a central line density greater than 3000 lines mm−1 was used. The introduction of the EBL‐written phase mask substantially simplified the NFH optics for pattern transfer. The characterization of the groove density distribution and diffraction efficiency of the fabricated VLSGs indicates that the EBL–NFH method is feasible and promising for achieving high‐accuracy groove density distributions with corresponding image properties. Vertical stray light is suppressed in the soft X‐ray spectral range.
- Subjects
SOFT X rays; ELECTRON holography; ELECTRON beam lithography; ELECTRON beams; FIREPLACES; PHOTOMASKS
- Publication
Journal of Synchrotron Radiation, 2019, Vol 26, Issue 5, p1782
- ISSN
0909-0495
- Publication type
Article
- DOI
10.1107/S1600577519008245