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- Title
Fault Detection of Linear Analog Integrated Circuit in Network.
- Authors
Li, Deliang; Huang, Kaoli; Wang, Changlong
- Abstract
This paper presents a novel network decomposition method that can detect faults of linear analog integrated circuit (IC) in network. The nodal admittance matrix (NAM) of linear analog IC is a function of its internal component values, which can be used for fault detection. However, it is difficult to obtain the NAM of linear analog IC in network. We propose a network decomposition based method to calculate the NAM of the IC under test in network. The IC under test is fault free, if its NAM lies inside the tolerance limit. Otherwise, it is faulty. The effectiveness of the proposed method is validated through benchmark circuits.
- Subjects
FAULT tolerance (Engineering); INTEGRATED circuit design; ANALOG circuits; ELECTRON research; ELECTRONIC circuits
- Publication
Journal of Electronic Testing, 2014, Vol 30, Issue 4, p483
- ISSN
0923-8174
- Publication type
Article
- DOI
10.1007/s10836-014-5468-2