We found a match
Your institution may have access to this item. Find your institution then sign in to continue.
- Title
Phase I control charts for times between events.
- Authors
Jones, L. Allison; Champ, Charles W.
- Abstract
A count of the number of defects is often used to monitor the quality of a production process. When defects rarely occur in a process, it is often desirable to monitor the time between the occurrence of each defect rather than a count of the number of defects. An exponential distribution often provides a useful model of the time between defects. Phase I control charts for exponentially distributed processes are discussed. Methods for computing the control limits are given and the overall Type I error rates of these charts are evaluated. Copyright © 2002 John Wiley & Sons, Ltd.
- Subjects
QUALITY control charts; POISSON processes; PROCESS control systems; MANUFACTURING processes; INDUSTRIAL engineering
- Publication
Quality & Reliability Engineering International, 2002, Vol 18, Issue 6, p479
- ISSN
0748-8017
- Publication type
Article
- DOI
10.1002/qre.496