Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleDetermination of CdSxSe1-x thick films optical properties from reflection spectra.AuthorsTIVANOV, Mikhail; KAPUTSKAYA, Irina; PATRYN, Aleksy; SAAD, Anis; SURVILO, Ludmila; OSTRETSOV, EvgenijAbstractA method for determining the band gap value and the refractive index near the absorption edge from reflection spectra was tested for CdSxSe1-x films prepared using the screen-printing and sintering technique.SubjectsOPTICAL properties of cadmium selenide; OPTICAL properties of cadmium sulfide; REFLECTANCE spectroscopy; BAND gaps; THIN filmsPublicationPrzeglad Elektrotechniczny, 2016, Vol 92, Issue 9, p88ISSN0033-2097Publication typeArticleDOI10.15199/48.2016.09.23