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- Title
X-ray and Auger microprobe studies of vanadium-doped layered chromium-copper disulfide crystals.
- Authors
Sokolov, V.; Korotaev, E.; Peregudova, N.; Kuchumov, B.; Prozorov, P.; Topyakova, M.; Mazalov, L.; Dikov, Yu.; Buleev, M.; Pichugin, A.; Filatova, I.; Berdinskii, A.; Velichko, A.
- Abstract
In the work, X-ray and Auger microprobe studies of the surface of crystals prepared from powder samples of CuCrVS disulfides ( x = 0÷0.11) by crystallization from melt in the sulfur vapor atmosphere. Sample slabs cut from ingots include crystalline layered blocks with different orientation of copper-containing extended linear inclusions separated by disulfide matrix layers. The results of the microprobe analysis of regions with copper-containing inclusions and the regions adjacent to them are presented.
- Subjects
MICROPROBE analysis; AUGER effect; VANADIUM; DOPING agents (Chemistry); CHROMIUM compounds; SULFIDE crystals; X-ray crystallography
- Publication
Journal of Structural Chemistry, 2014, Vol 55, Issue 5, p852
- ISSN
0022-4766
- Publication type
Article
- DOI
10.1134/S0022476614050084