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- Title
Measuring Technical Change Under Variable Returns to Scale: A Dual Approach.
- Authors
Wan, Guang H.
- Abstract
In this paper, a dual measure of technical change is developed. The measure does not require parametric specification or estimation of the underlying technology, nor the assumptions of constant returns to scale and perfect competition. Imposing these assumptions, the proposed measure is shown to be equivalent to Solow's productivity residual. Biases attributable to these assumptions are analysed.
- Subjects
TECHNOLOGICAL innovations; INDUSTRIAL productivity measurement; PARAMETRONS; PERFECT competition; PRODUCTIVITY accounting; INDUSTRIAL productivity; COMPETITION
- Publication
Bulletin of Economic Research, 2000, Vol 52, Issue 1, p59
- ISSN
0307-3378
- Publication type
Article
- DOI
10.1111/1467-8586.00094