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- Title
3D Atom Probe Tomography Study on Segregation of Yttrium in Modified Al-Si Alloys.
- Authors
De-Giovanni, Mario; Srirangam, Prakash; Alam, Talukder; Banerjee, Rajarshi
- Abstract
Yttrium segregation behavior in Al-Si alloys has been studied using the three-dimensional atom probe tomography technique. Al-Si alloys were prepared by casting method, and yttrium was added to modify the eutectic silicon morphology in these alloys. The results indicated that yttrium is preferentially located within the Si phase, with the highest concentration at the interface between eutectic Al and eutectic Si.
- Subjects
ALUMINUM-silicon alloys; ATOM-probe tomography; AUTOMOBILE industry; MICROSTRUCTURE; EMISSION spectroscopy
- Publication
JOM: The Journal of The Minerals, Metals & Materials Society (TMS), 2018, Vol 70, Issue 9, p1765
- ISSN
1047-4838
- Publication type
Article
- DOI
10.1007/s11837-018-2909-x