Back to matchesWe found a matchYour institution may have access to this item. Find your institution then sign in to continue.TitleIndividual particle analysis for source apportionment of suspended particulate matter using electron probe microanalysis.AuthorsKim, B. A.; Tomiyasu, B.; Owari, M.; Nihei, Y.PublicationSurface & Interface Analysis: SIA, 2001, Vol 31, Issue 2, p106ISSN0142-2421Publication typeArticleDOI10.1002/sia.964